Phoenix V | Tome | X M.
The phoenix v|tome|x m is a versatile X-ray microfocus CT system for 3D metrology and analysis with up to 300 kV / 500 W. For the first time, GE’s unique X-ray tube is available in a compact CT system for industrial process control as well as for scientific research applications. Beyond down to < 1 µm detail detectability, the system offers industry leading magnification and power at 300 kV. GE’s high dynamic DXR digital detector array and the click & measure|CT automatization functionality make it an efficient 3D tool. The v|tome|x m is the first industrial mircoCT scanner with GE’s breakthrough scatter|correct technology. This technological advancement automatically removes scatter artifacts from CT volume, allowing users to gain significant improved CT results compared to conventional cone beam microCT.
请求报价
我们为自己提供快速交付而自豪。然而，库存迅速变化，有时一些物品可能没有库存。如果您需要加急装运，请通过电子邮件联系我们或致电我们的办公室确认物品的可用性。*标称交货时间因产品而异。
客户福利
- 第一个具有先进散射的工业微克系统，用于高度改善的CT质量水平的正确技术与传统的微孔锥梁CT相比
- 使用最小操作员培训进行高精度3D计量和非破坏性测试任务
- 高功率的x射线管、高效、快速的探测器技术和高自动化水平提高了产量
- 由于唯一的GE DXR探测器阵列（最多30 FPS），非常快速的CT数据采集，非常高的图像质量
- 系统的所有主要硬件和CT软件组件都是专有的GE技术与彼此最佳地兼容
- NEW: The phoenix v|tome|x m is now also available in specific countries as special metrology edition with a measurement accuracy of 4+L/100 µm referring to VDI 2630 guideline (measured as deviation of sphere distance in tomographic static mode SD (TS), method details referring to VDI 2630-1.3 guideline on request, valid only for phoenix v|tome|x m metrology edition).
主要特点
- 首个紧凑的300 kV微聚焦CT系统，具有< 1µm的细节检测能力
- 高吸收样品的行业领先的放大和功率为300 kV
- 高功率μCT的独特双管配置以及高分辨率NanoCT®
- 先进的phoenix datos|x CT软件，具有自动点击和测量|CT选项，优化了易用性
- 优化的CT采集条件和三维计量包，包括温度稳定的x射线管、数字探测器阵列和机柜，以及高精度直接测量系统
